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    Applying and detecting tip-induced local strain on monolayer MoS 2 /graphite with scanning tunneling microscopy and inelastic electron tunneling spectroscopy
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    Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation P. Sutter; Energy‐Filtered Scanning Tunneling Microscopy using a Semiconductor Tip. AIP Conf. Proc. 18 December 2003; 696 (1): 28–36. https://doi.org/10.1063/1.1639674 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioAIP Conference Proceedings Search Advanced Search |Citation Search
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    By using scanning tunneling microscopy/spectroscopy, we have studied the current–voltage characteristics of two-dimensional (2D) Au clusters, thermally deposited on self-assembled alkanethiol monolayer. The curves display Coulomb blockade and staircase with asymmetric behavior. The measured zero conductance gap as a function of cluster size is in excellent agreement with classical model calculations, in which the 2D Au island is treated as metallic in the planar direction but nonmetallic in the normal direction.
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