Automatic test system for some kind general electronic equipment
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Abstract:
The advancement of test system for electronic equipment must keep pace with the complexity of modern electronic equipment. VXI bus technology has been becoming the mainstream of computer test and control, and also is the core of standardization for automatic test equipment. A kind of automatic test equipment for general electronic system based on VXI technology is presented in this paper. The hardware design and software system are discussed and the system performance is also analyzed. The software design requirement of fault diagnosis based on expert system is also introduced.Keywords:
Automatic test equipment
Test equipment
System under test
Test data collection is increasingly seen as an important functionality of the ATE. The lack of clear specification parameters makes comparison of different ATE equipment with regard to data collection a difficult job. In this paper, the approach of Infineon Technologies is presented. Evaluation scenarios for measuring the performance of new ATE equipment regarding diagnosis data acquisition during production test are described. Evaluation results of "state-of-the-art" test equipment are compared and the deficiencies of today's test equipment are discussed compared to Infineons requirement "zero run time overhead"
Automatic test equipment
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Test equipment and other products that support test have continuously evolved along with the rest of the electronics technology. That is, for the same or better performance, modern test equipment packaging is much smaller and lower cost. In addition, test equipment controls and data interface directly with a computer data bus and/or standard computer I/O. Modern test equipment, PC computers, windows operating systems, high level test languages, and test programs can be combined in a system design that. Provides weapon system electronics testing at all levels of operational support (from depot to forward operating base). Therefore, a test system design and test program sets can be made for a weapon system that replaces the present practice of multiple specialized designs. The same can be said for supporting several different weapon systems deployed to the same forward operating base. This common test system design concept provides significant cost savings and increased support flexibility. This paper addresses the following topics: (i) test systems role in weapon system operational support; (ii) types of electronics testing required; (iii) COTS hardware and software test systems; (iv) one test system design that can do it all; (v) concept of operation; (vi) real test system example.
Automatic test equipment
Test harness
Weapon system
Test equipment
System testing
System under test
Interface (matter)
Test Management Approach
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An automatic test system is composed of parts that are basically refined versions of standard measurement and test instruments. The instruments used in the automatic test system must be automatically programmable to provide the stimulus or measurement range called for by the test program and they must be capable of receiving these programmed instructions from a computer or controller that serves as the test interpreter, director, and decision maker for the test system. Another characteristic of an automatic test system is that it requires its test instruments to be capable of being connected in any desirable electrical configuration by the test systems switching matrix. The final requirement of a test system is that it have some type of man-machine interface such as a printer or visual display to inform the operator of test results and/or provide him with instructions. The number of automatic test systems in use in Canada and the U. S. today has grown greatly over the last few years. These systems fall into two categories: they are either integrated systems, composed from building blocks of general-purpose programmable measurement and stimulus devices or they are dedicated systems, comprised of specially designed special-purpose stimulus and measurement devices aimed at a specific task. This paper will examine the advantages and disadvantages of both approaches to test system design. It will highlight factors that must be considered before choosing either and will illustrate subtle and intangible aspects of this decision, which can prove crucial over the long run.
Automatic test equipment
System under test
System testing
Test harness
Device under test
Test Management Approach
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Currently bus communication technology used extensively in airborne equipment, so most of the test equipment is based on a variety of bus, but in addition to ICD file, the same form of these equipment have the same form. So we designed a portable test system of aero electronic equipment. The system has a simple hardware structure and software design using separate form. The system meets the test requirements of different devices by editing ICD files on different devices. In addition, the system also can measure analog signals and complete discrete I/O control. After a trial in army showed that the system reached the requirements of the test specification and reduced the military's investment in testing equipment to a certain extent.
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ELECTRONIC AND ELECTROMECHANICAL UNITS in electronic systems may require over a thousand separate tests to diagnose the nature and location of any fault. During production and maintenance of these units, computer controlled automatic test equipment (ATE) has had to be used. This was often complex, costly and unreliable, due to the large number of test instruments which the ATE comprised.
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Long testing time, low efficiency and large volume are the major problems of the test system launcher equipment of one air defense missile, which is also one of the exclusive testing equipment. To address those issues, a new FPGA-based test system for launcher is proposed with corresponding framework of hardware and software , which is designed through the analysis of the test parameters and performing classification of the test signal. The design takes advantage of the characteristics of the FPGA. The test system is highlighted with small volume, high scalability, fast test speed and high efficiency.
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System testing
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The volume of unit under test (UUT) devices that can be tested on automatic test equipment (ATE) is ultimately determined by the test time for those devices. Conversely, the number of devices to be tested over a period of time establishes how much ATE is required. The amount of ATE required not only drives the acquisition costs but the costs associated with maintaining and supporting the ATE. As a result, no other topic seems to generate more attention in the ATE industry than test time. This focus has driven ATE manufacturers to produce faster test equipment and the test engineering community to identify efficient methods for detecting and isolating faults quickly. Today there is a large suite of specialized commercial-off-the-shelf (COTS) test equipment that is a result of the test time focus. Test system designers integrate a diverse set of specialized equipment to produce a sophisticated test system with the capability to test a large collection of dissimilar UUT devices. One of these test systems built with the freshest and fastest equipment may give one the impression that re-hosting a UUT from a legacy test system to the new test system should decrease the UUT test time from what it was before. The thought process would go as follows. "The new test system is twice as fast as the old. We should be able to test the UUT in half as much time as before. Therefore, the new requirement is old divided by two." This paper addresses this scenario where unrealistic test time requirements were imposed on several UUTs. The paper addresses specifically how the problem was approached, how the problem was resolved, and some of the specific techniques used to decrease test time on a COTS based test system.
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Test equipment
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As an important part of military equipment,an automatic test system can obviously reduce the maintenance time of weapon system.The development of technology and the military demand bring the extensive use of general purpose automatic test system.The general purpose automatic test system for airborne equipment is an exoteric and distensible test system.The key to the implementation of general-purpose automatic test system is the standardization of system hardware structure,software structure and basic components,and test program language.In combination with the application of airborne electronic equipment,this paper presents the design flow,analysis method of test demand,hardware design and implementation,method of software design and implementation of general purpose automatic test system of airborne equipment,and presents its application prospects through particular test and analysis of the designed general purpose automatic test system.It can satisfy the requirements of general purpose.
Automatic test equipment
General purpose
Test harness
Test equipment
Test Management Approach
System under test
Realization (probability)
System testing
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Test equipment
Automatic test equipment
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In this contribution, we describe current developments in the automatic test equipment (ATE) industry with respect to the hardware and software. For testing mixed-signal interface devices, such as digital-to-analog and analog-to-digital converters (DACs and ADCs) the standard test setups are examined. In particular, limitations are identified that lead to exponentially increasing test time for high-resolution converters. Examples of innovative approaches to keep this test cost increase at bay are outlined.
Automatic test equipment
Test equipment
Interface (matter)
Device under test
Analogue electronics
Mixed-signal integrated circuit
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