<title>Plasma x-ray source of various materials produced by compact solid state lasers</title>
Guan-ming ZengHiroyuki DaidoShigeru NakayamaK. MuraiTakeshi NishikawaShuji KiyokawaH. TakabeHiroaki AritomeMasahiro NakatsukaY. KatoSadao Nakai
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X-ray emission spectra in the wavelength range of 2 - 13 nm from 21 kinds of material (carbon through tin) irradiated either by a 4 J/35 ns slab Nd:glass laser or by a 0.5 J/8 ns Nd:YAG laser were recorded with a grazing incidence spectrometer equipped with a microchannel plate detector. The absolute photon intensities of these spectra were determined by simultaneous measurement of the emission from a molybdenum plasma with the grazing incidence spectrometer and a transmission grating spectrometer. For the carbon plasma, the electron temperature and density are derived from the spectrum and the conditions for intense Lyman (alpha) line are discussed. Finally, we describe the application to an x-ray microscope with the laser-produced carbon plasma.MIR Spectrometers Dispersive Spectrometers Fourier-Transform Spectrometers NIR Spectrometers FT-NIR Spectrometers Scanning-Grating Spectrometers Diode Array Spectrometers Filter Spectrometers LED Spectrometers AOTF Spectrometers Raman Spectrometers Raman Grating Spectrometer with Single Channel Detector FT-Raman Spectrometers with Near-Infrared Excitation Raman Grating Polychromator with Multichannel Detector UV/VIS Spectrometers Sources Monochromators Detectors Fluorescence Spectrometers
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One of the most promising approaches to laser-induced breakdown spectroscopy (LIBS) experiments involves the use of an echelle spectrometer coupled with an intensified CCD. Even if drawbacks remain with its use, the echelle spectrometer facilitates a multielemental analysis that is more rapid than can be obtained with the more-conventional Czerny-Turner spectrometer and, moreover, does not sacrifice reliability. Quantitative results obtained with such apparatus for solids, liquids, powders, and gases are described and when possible compared with results from Czerny-Turner spectrometers. Liquid analysis by LIBS with echelle spectrometers has allowed a spectral database to be compiled. Once the qualitative spectra of pure elements in aqueous solutions, are obtained, they can be used for qualitative analysis of unknown samples.
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Some experiments are described in which a counter-spectrometer method is compared with an X-ray photographic method as a means of determining the integrated reflexion of a number of reflexions. The advantages and limitations of the photographic, ionization and counter-spectrometers are discussed, and it is concluded that for long exposures the photographic spectrometer is as sensitive as the counter-spectrometer used for a few minutes and more sensitive than the ionization spectrometer. For convenience and speed of measurement the counter-spectrometer is probably the best instrument.
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At first, the general design of an X-ray spectrometer and the performance of the main components are discussed. This concerns the energy resolution as well as the parameters that influence the same. Further parameters such as count rate capability, detection efficiency, and operating costs are discussed too, separately for wavelength- and energy-dispersive instruments. In the second part, the different types of spectrometers are presented – both energy-dispersive spectrometer (EDS) and wavelength-dispersive spectrometer (WDS), but also spectrometers with a special measurement geometry as total reflection or instruments with spatial resolution. Here also examples of commercially available instruments for every instrument type are presented.
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