The influence of impurity on the critical thickness of the CeO2 buffer layer for coated conductors

Science in China. Series G, Physics, mechanics & astronomy/Science in China. Series G, Physics, Mechanics & Astronomy (2009)

Min Pan Zhengguo Huang HuanFeng Ma Qiang Wei-Rong Lian-Fu Wei Long Wang Yong Zhao

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Abstract:

The lattice parameters, band structure, density of state and elastic constant of RE-doped CeO2 (RE=Sm, Gd, Dy), the buffer material for coated HTS conductors, are calculated using the plane-wave method with pseudopotentials based on the density functional theory (DFT) of first-principle. The rule and mechanism of the effect of rare earth impurity on the critical thickness of the CeO2 buffer layer are investigated. It is found that, in the range of the calculation, the changes of the lattice volume V and elastic constant E* of CeO2 with the impurity are mainly determined by the increased electrons δn e of the system. The relationship of the elastic constant E* and increased electrons δn e is established. It is indicated that the critical thickness of the CeO2 single buffer layer doped with Sm, Gd, and Dy may be enhanced by 22%, 43% and 33%, respectively.

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Lattice constant

Buffer (optical fiber)

Lattice (music)

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Physics of Superconductivity and Magnetism

Advancements in Solid Oxide Fuel Cells

High-pressure geophysics and materials

10.1007/s11433-009-0141-y

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A Graphical Method for Selecting Suitable Targets for Precision Determination of Cubic Lattice Constants and for Solving Cubic Powder Patterns

Journal of Applied Physics (1940)

Louis A. Carapella

Graphical charts from which the angles of diffraction lines may be obtained as a function of lattice constant and radiation have been prepared for cubic powder patterns. The charts are especially useful in predicting positions of back-reflection lines in order that suitable targets for precision determinations of lattice constants may be chosen. Moreover, cubic powder patterns may be quickly indexed, beta-lines identified, and lattice constants read to better than one percent. No calculations are necessary after the angles of diffraction have been measured.

Lattice constant

Lattice (music)

Cubic crystal system

Powder Diffraction

Cubic function

10.1063/1.1712805

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The Relationship between Buffer Solution pH and its Buffer Capacity

Guangzhou Chemical Industry (2013)

Yang Xiao-jiong

The buffer capacity of buffer solutions with different pH made by the same conjugate acid-base and the same total concentration was studied in the given ΔpH buffer range.The results obtained showed that the buffer capacity of buffer solutions to acid or base were not all maximum at pH=pKa if buffer solutions with different pH made by the same conjugate acid-base had an equal total concentration and buffer ranges ΔpH were proposed

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Buffer solution

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Conjugate acid

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Strain Effects in the X-ray Determination of Lattice Parameters in Pd-Hx

Springer eBooks (1983)

Paul Hardy I S Balbaa F.D. Manchester

Lattice constant

Lattice (music)

10.1007/978-1-4684-7630-9_15

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Effect of impurities on optical qualities of KDP crystal

High Power Laser and Particle Beams (2004)

Changshui Fang

Effects of certain impurities, which exit in growth solution of KDP crystal, on optical qualities of KDP crystal were investigated. The results showed that the effects of different kinds of impurities are not the same. The reason can be ascribed to the chemical structure and chemical bonds between the impurities and surface atoms of KDP crystal are not same.Those impurities have similar structure and easy to form H bonds with [H_2PO_4]~-,such as pyrophosphate and sulfate affect pyramidal sector of KDP crystal easily while the other impurities, such as Cl~- have no evident effect on the growth and properties of KDP crystals.

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Triglycine sulfate

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Structural properties of relaxed Ge buffer layers on Si(0 0 1): effect of layer thickness and low temperature Si initial buffer

Journal of Materials Science Materials in Electronics (2004)

T. Myrberg Ajey P. Jacob Omer Nur M. Friesel M. Willander

Buffer (optical fiber)

10.1023/b:jmse.0000031594.36498.27

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