Five-layer quarter-wave antireflective coatings for the IR region
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This paper discusses the conditions for obtaining the structure of a five-layer antireflection interference coating that contains layers of different thicknesses. Regions of allowable values are given for the refractive index of the layers that form this coating and make it possible to obtain three or five zero values of the reflectance. The resulting structures of five-layer coatings create the possibility of reducing the reflectance of optical materials with either high or low refractive indices. The given coatings are capable of reducing the reflectance in several spectral regions simultaneously.Keywords:
Anti-reflective coating
Optical coating
Reflection
The laser-induced damage thresholds for λ=1.06 μm of commercially available (produced at Institute of Optics) dielectric optical coatings, both antireflective and high reflectance, have been determined. The dependence of the optical coatings stability on design and selection of materials has been investigated. An improvement of the coatings durability by using nonquarterwave layers in addition to the basic design of the mirrors has been obtained. The choice of the coating materials is also discussed.
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In view of the problem that the low visibility of interference fringes of interferometer affects the accuracy of measurement, the intensity distribution of the interference of thin film is investigated with theoretical calculation. The influences of the reflectivity of the film on the intensity distribution and the visibility of the fringes are discussed and the relation between the reflectivity and the visibility is deduced. The results show that the optimal numerical range of the reflectivity with high clarity of the fringe is in the vicinity of 0.5.
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The spectrophotometer described is designed to measure specular reflectance with a high degree of accuracy. It can measure shape piece, antireflective or reflective coating and make cartographies in order to detect heterogeneities of coating.
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Anti-reflective coating
Molar absorptivity
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Analyser
Spin Coating
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Based on the Fresnel formula,the reflectivity formula of multilayer was derived using recursive method.In addition,the program for reflectivity calculation is obtained by Visual Basic.The reflectivity of typical antireflective coating and highrefelctive coating were calculated by this program.
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X-ray reflectivity
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Laser 3D nanolithography enables the fabrication of complex shape micro-optical elements. The freedom of multi-surface designs of such components has cost them to suffer from reflection losses. This work presents the deposition of an Antireflective (AR) coating, using Atomic Layer Deposition (ALD), on hybrid organic-inorganic polymer SZ2080™ microstructures and micro-lenses fabricated using Laser Direct Writing (LDW). The single-wavelength AR coating produced using ALD successfully reduced reflection from 3.3 % to 0.1 % at 633 nm for one surface of SZ2080™.
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A study on low-refractive-index SiO2 antireflective (AR) coatings by a sol-gel method is reported. Variations in the properties of the coatings are related to the molar ratios of ammonia to deionized water being changed in the process of preparing the sols. From the performance test results, the optimal ratio of the reactants necessary to prepare low-refractive-index SiO2 AR coatings is determined. Of all the SiO2 AR coatings, the lowest recorded refractive index is 1.16 at a wavelength of 700 nm. The largest water contact angle is 121.2°, and the peak transmittance is 99.95% at a wavelength of 908 nm. Furthermore, the sol used to deposit the film with the lowest refractive index is stable because of the narrow size distribution of its constituent particles.
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Abstract The work presents optical properties of sol‐gel derived porous silica films of low refractive index, from 1.2 to 1.3. Due to low refractive index, the porous silica films can be applied to reduce the light reflection coefficient. This allows porous silica films as good candidates for the antireflective coatings (ARC) production. The spectroscopic ellipsometric measurements have been performed for the refractive indices and thickness of silica films determination. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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A hybrid antireflective coating combining homogeneous layers and linear gradient refractive index layers has been deposited using different techniques. The samples were analyzed optically based on spectrophotometric and spectroscopic ellipsometry measurements under different angles of incidence in order to precisely characterize the coatings. The Lorentz-Lorenz model has been used to calculate the refractive index of material mixtures in gradient and constant index layers of the coating. The obtained refractive index profiles have been compared with the targeted ones to detect errors in processes of deposition.
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In this study, reflective and antireflective coatings were designed and simulated. Optical transmission and reflection values were deduced with a matrix formulation via a personal computer. It was found that the number of layers affects the optical performance. The width of the highreflectance region in the reflectance curves decreases, while its height increases with the increasing number of layers for the reflective coating design. The antireflection coatings transmit about 99.89% in a broad high-pass band at the central wavelength of λ0 = 450 nm. In addition, simulated Fabry-Perot filters result in a single sharp transmittance peak at the desired central wavelength. The half-width of the transmission band at central wavelength decreases and its peak height increases with the increasing number of the coated layers. To compare with theory, both sides of a glass substrate were deposited a two-layer coating of MgO/MgF2 via electron beam evaporation, to produce an antireflective coatings in the visible and near infrared regions. The optical properties of prepared films were studied through optical transmission measurements. The peak transmittance was 98.2% at the central wavelength λ◦ = 450 nm.
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