Interpretation of interference patterns obtained from X-ray Laue interferometers in primary plane waves
2
Citation
24
Reference
10
Related Paper
Citation Trend
Abstract:
The situations leading to the emergence of Moiré patterns in X-ray interferometers and the dependence of the period of these Moiré patterns on the wavelength and the order of reflection are investigated. The definite conditions of the emergence of Moiré patterns are elaborated. It is demonstrated, that not all the rotations of the reflecting planes and not all the differences in interplanar spacings in interferometers lead to the formation of Moiré patterns. It is shown also, that the period of Moiré patterns inside the crystal does not depend on the wavelength, whereas outside the crystal, this dependence is of a periodic character. The period is reduced along with an increase in the order. [Russian Text Ignored].Keywords:
Moiré pattern
Reflection
Crystal (programming language)
We have developed a two-dimensional nano-displacement measuring system utilizing a combined optical and x-ray interferometer (COXI). The system consists of optical interferometers for two-dimensional displacements and an x-ray interferometer. The x-ray interferometer was used to calibrate the non-linearity of the optical interferometers. The x-ray interferometer can subdivide the optical interference signal with 0.2 nm linear scales. The measured non-linearity of the heterodyne optical interferometer was less than 2 nm. The calibrated optical interferometers were used to measure two dimensional nanoscale displacements, and the accuracy of the optical interferometers was reduced to sub-nanometer after the compensation. To demonstrate the application of the system, we have measured the non-linearity of capacitive sensors using the calibrated optical interferometers.
Linearity
Heterodyne (poetry)
Nanometrology
Interferometric visibility
Cite
Citations (0)
For all of the interferometers, alignment has played a key role in manufacturing them. Alignment goals are reproducible results across systems, easy to use and understand, altering overall mechanical design as little as possible, using the loosest tolerances required to achieve results. This paper describes four typical interferometers and their alignments. They are 1.06um interferometer, 24" large aperture phase shifting interferometer, Ritchey-Common testing and microscope interferometer as well.
Cite
Citations (3)
Small and simple ultra-violet interferometer is designed. The interferometer consists of very small ball and concave mirrors. The interferometer can be tested in a vacuum chamber or in space for ultra-violet region for better precision. Interferometer can be used in a very large spectral region as it consists of mirror surfaces only. It is possible to use the interferometer to test optics of a space interferometer or a space telescope. These interferometers are very cheap and easily can be manufactured in quantity. Interferometers are very small that is why they are especially recommended for testing optics in space.
Interferometric visibility
Atom interferometer
Intensity interferometer
Cite
Citations (0)
For certain radio astronomical purposes in which only fringe amplitudes are of interest, it is shown that the correlating interferometer and the postdetection correlation interferometer are extreme ends of a spectrum of interferometer types. Intermediate-type interferometers have a higher signal-to-noise ratio than do postdetection interferometers yet do not require the phase stability of correlation interferometers.
SIGNAL (programming language)
Cite
Citations (17)
Moiré pattern
Cite
Citations (3)
An approach for compensating the influence of interrogator noises on the readings of interferometric sensors, interrogated by means of spectral interferometry with wavelength tuning, is proposed. Theoretical analysis and a proof-of-principle experiment were performed for the example of extrinsic Fabry-Perot interferometers. Two schemes, comprised of a signal and reference interferometers, switched in different optical channels of the interrogating unit, were proposed. The approach is based on the fact that the fluctuations of some of the interrogator parameters produce correlated fluctuations of the reference and signal interferometers' optical path differences' (OPDs) measured values. The fluctuations of the reference interferometer's measured OPD can be subtracted from the measured OPD of the signal interferometer. The fluctuations of different parameters of the interrogator are considered, the correlation properties of the produced noises of the measured OPD values are demonstrated. The first scheme contains two interferometers with similar parameters and enabled a threefold resolution improvement in the performed experiments, when the difference of the interferometers OPDs was varied within about 10 nm. The second scheme contains two interferometers with OPDs difference such that all interrogator fluctuations, except for the dominating one, produce uncorrelated OPD errors. With the second scheme, a twofold resolution improvement was experimentally demonstrated when the interferometers' OPDs difference was varied within more than 1 μm. The proposed approach can be used for improving the resolution of interferometric sensors with relatively large OPDs (greater than 200-300 μm), which can be advantageous for remote materials and surface inspection. The other potential application is the use of relatively simple cheap interrogators with poor wavelength scale repeatability for high-precision measurements.
SIGNAL (programming language)
Optical path length
Intensity interferometer
Interferometric visibility
Cite
Citations (9)
Abstract In this article we present a new representation-free formalism, which can significantly simplify the analysis of interferometers comprised of atoms moving in time-dependent linear potentials. We present a methodology for the construction of two pairs of time-dependent functions that, once determined, lead to two conditions for the closing of the interferometer, and determine the phase and the contrast of the resultant interference. Using this new formalism, we explore the dependency of the interferometer phase on the interferometer time T for different atom interferometers. By now, it is well established that light pulse atom interferometers of the type first demonstrated by Kasevich and Chu (1991 Phys. Rev. Lett. 67 , 181–4; 1992 Appl. Phys. B 54 , 321–32), henceforth referred to as Mach–Zehnder (MZ) atom interferometers, have a phase scaling as T 2 . A few years ago, McDonald et al (2014 Europhys. Lett. 105 , 63001) have experimentally demonstrated a novel type of atom interferometer, referred to as the continuous-acceleration bloch (CAB) interferometer, where the phase reveals a mixed scaling which is governed by a combination of T 2 and T 3 . Moreover, we have recently proposed a different type of atom interferometer (Zimmermann et al 2017 Appl. Phys. B 123 , 102), referred to as the T 3 -interferometer, which has a pure T 3 scaling, as demonstrated theoretically. Finally, we conclude that the CAB interferometer can be shown to be a hybrid of the standard MZ interferometer and the T 3 -interferometer.
Atom interferometer
Interferometric visibility
Formalism (music)
Cite
Citations (13)
In white-light interferometry, two unbalanced interferometers are coupled in tandem. Typically, two Michelson interferometers are used. The optical pathlength difference between the two arms in each interferometer is large compared to the source coherence length. The measurand acts on one arm of the sensing interferometer, determining its optical pathlength. The length of one arm of the second interferometer, which is called the reference or receiving interferometer, is scanned, and a visibility maximum is observed when the pathlength mismatch is the same for the two interferometers [1]. The technique is closely related to a multiplexing technique called coherence multiplexing, in which fiber-optic Mach-Zehnder interferometers [2,3] or polarimeters [4] are often used.
Interferometric visibility
White light interferometry
Visibility
Cite
Citations (1)
In this work, we present a two-step phase shifting interferometer based on two-coupled interferometers. The system generates two-interferograms. We analyzed the cases of four-pattern captured in two steps; the results obtained for transparent samples are presented.
Cite
Citations (0)
The new design of three-frame interferometer is proposed. The optical system of the interferometer, though very simple, has some advantages in comparison with classical interferometers (e.g., Mach-Zehnder interferometer). For registration and analysis of interferograms the CCD cameras and multichannel image acquisition system are used. The interferometer has been tested in a laser-matter experiment. Some results of plasma investigation are presented.
Cite
Citations (2)