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Probing Carrier Transport across Patterned Interfaces with Ballistic Electron Emission Microscopy
Probing Carrier Transport across Patterned Interfaces with Ballistic Electron Emission Microscopy
2016
Westly Nolting
Christopher Durcan
Robert Balsano
Viincent Labella
Keywords:
Analytical chemistry
Ballistic electron emission microscopy
Materials science
Optoelectronics
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