X-ray equipment for laboratory and synchrotron studies of thin-film crystalline structures

The capabilities of X-ray equipment produced by Radicon Ltd. for the high-resolution structural investigation of single crystals and thin films using different methods including high-resolution methods, are demonstrated. A double-crystal DSO-1T X-ray diffractometer with a large sample-to-detector distance and a narrow slit in front of the detector allows one to perform high-quality mapping of the GaAs/GaP/Si heteroepitaxial structure in reciprocal space. A new double-crystal PDP console for the DRON-3 diffractometer provides the mapping of large wafers through the use of rocking curves. A new specialized X-ray DSO-2-01 diffractometer equipped with a motorized console for linear displacement of detector and rotary slit changer in front of the detector ensures automatic crystal orientation and precise measurements of the crystal lattice. All X-ray diffractometers manufactured by Radicon have rather flexible software including a custom macros editor.