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New ultra-high density textured Poly-Si floating gate EEPROM cell
New ultra-high density textured Poly-Si floating gate EEPROM cell
1986
D. Guterman
B. Houch
L. Starnes
B. Yeh
Keywords:
Non-volatile memory
EEPROM
Electronic engineering
EPROM
Physics
Quantum tunnelling
Electrode
Optoelectronics
Anode
Voltage
Dielectric
Correction
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