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Transverse beam profile measurement for slow extracted beam in HIBMC
Transverse beam profile measurement for slow extracted beam in HIBMC
2017
Yasutoshi Kuriyama
Yoshihiro Ishi
Tomonori Uesugi
Yasuhiro Fuwa
Daisaku Suga
Takashi Akagi
Masakazu Shimizu
Shuichi Harada
Tomoaki Okimoto
Keywords:
Semiconductor device
Electromagnet
Magnetic field
Radiation protection
Beam (structure)
Irradiation
Optics
Materials science
Electrical equipment
Magnet
Correction
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