Time-of-flight mass spectrometer for measuring ratio of nano-particle component elements in real time

The invention relates to a time-of-flight mass spectrograph, in particular to a time-of-flight mass spectrometer for measuring ratio of nano-particle component elements in real time, comprising a pulse sampling device, a beam source chamber and a time-of-flight mass spectrum mass analyzer provided with an ionization chamber. The time-of-flight mass spectrometer is characterized in that the ionization chamber is positioned in the time-of-flight mass spectrum mass analyzer, the front end of the pulse sampling device is connected with a pulse valve, the pulse sampling device is inserted into the beam source chamber, the beam source chamber is positioned directly above the laser ionization chamber, the outlet of the beam source chamber is connected with the laser ionization chamber through a nozzle, a nanosecond long wavelength high-energy laser is installed at the outer side of the time-of-flight mass spectrum mass analyzer, the high-energy laser beams emitted by the laser pass through the ionization chamber vertically so as to ionize nano-particles completely into univalent and high valence ions, the ratio of the high valence ions can accurately reflect the ratio of nano-particle component elements, and the ions produced by ionization can be recorded by the time-of-flight mass spectrograph. The invention can measure the ratio of nano-particle component elements rapidly, and the measurement is not influenced by ionization laser energy.