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Oxide-Charge-Induced Impurity Level in Silicon Inversion Layers
Oxide-Charge-Induced Impurity Level in Silicon Inversion Layers
1975
A. Hartstein
A. B. Fowler
Keywords:
Oxide
Condensed matter physics
Charge density
Atomic physics
Impurity
Thin-film transistor
Oxide thin-film transistor
Inversion (meteorology)
Field-effect transistor
Physics
Silicon
Correction
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