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On-wafer human metal model measurements for system-level ESD analysis
On-wafer human metal model measurements for system-level ESD analysis
2009
Scholz
Linten
Thijs
Sawada
Nakaei
Hasebe
LaFonteese
Vashchenko
Vandersteen
Hopper
Groeseneken
Keywords:
Electrostatic discharge
Optoelectronics
Wafer
Stress (mechanics)
Metal
Hidden Markov model
system level
Materials science
Correction
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