High-throughput detection method for grain form parameters

The invention discloses a high-throughput detection method for grain form parameters. The high-throughput detection method includes the steps: setting up a grain form detection platform; calibrating a detection environment; acquiring and segmenting an image; extracting a contour and acquiring characteristic parameters; sieving adhered grains and impurities by the aid of a grain form parameter preset threshold; analyzing an image in the contour and realizing high-throughput color and texture characteristic detection; outputting grain form parameter detection results. The detection results are accurate and reliable, and compared with a manual measuring method, the grain form parameter detection method greatly improves detection efficiency and stability. The detection requirement for the grain form parameters in gene research can be met, the method is simple to implement, detection is efficient and accurate, and application requirements are met.