Test device and test system having the same

And each including a plurality of semiconductor device testing apparatus for testing, the test header, a plurality of test sites, and the test control device comprising a plurality of test pads connected to a plurality of functional blocks and a plurality of functional blocks . Test header includes a plurality of test channels. A plurality of test sites is equipped with a plurality of semiconductor devices. Test control device is assigned to at least a portion of the plurality of test pads comprising a plurality of test channel to a plurality of semiconductor devices mounted on a plurality of test sites. The number of a plurality of test sites is larger than that obtained by dividing the number of the plurality of test channels as the number of the plurality of test pads included in each of a plurality of semiconductor device value.