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Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect
2011
Aarestad
Lamech
Plusquellic
Acharyya
Agarwal
Keywords:
history effect
Design for manufacturability
Silicon on insulator
Process (computing)
Logic gate
Computer science
Mechanical engineering
Die (integrated circuit)
Correction
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