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The analysis of nanomechanical properties of Candida spp. by atomic force microscopy (AFM) method
The analysis of nanomechanical properties of Candida spp. by atomic force microscopy (AFM) method
2019
Małgorzata Tokarska-Rodak
Sławomir Czernik
Marta Chwedczuk
Dorota Plewik
Tomasz Grudniewski
Ewa Teresa Pawłowicz-Sosnowska
Keywords:
Atomic force microscopy
Nanotechnology
Materials science
Chemical engineering
candida spp
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