A study of PtCo films used for longitudinal recording

Abstract PtCo films have been sputter-deposited onto electron transparent Si 3 N 4 windows so that the microstructure and magnetic properties can be examined in an electron microscope. These films are longitudinally recorded using a motorised xy stage, and the recording structures can be examined using a number of techniques associated with transmission electron microscopy and magnetic force microscopy. This paper describes investigations into the recording properties and microstructure of PtCo films using various microscopy techniques.