Compendium of TID influence on SEE sensitivity investigation
2017
Investigation of total ionizing dose influence on the main single event effect types are presented. The devices under test are ADUM1200 (SEL), 8-bit shift register (SEL), SRAMs K6R4016C1D and K6R4016V1D (SEL, SEU), ATMEGA128 (SEL, SEU), LM124 (SET) and IRF3710 (SEB) were studied.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
8
References
3
Citations
NaN
KQI