Compendium of TID influence on SEE sensitivity investigation

Investigation of total ionizing dose influence on the main single event effect types are presented. The devices under test are ADUM1200 (SEL), 8-bit shift register (SEL), SRAMs K6R4016C1D and K6R4016V1D (SEL, SEU), ATMEGA128 (SEL, SEU), LM124 (SET) and IRF3710 (SEB) were studied.