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Current transport mechanisms in (HfO 2) x(SiO 2) 1-x/SiO 2gate stacks
Current transport mechanisms in (HfO 2) x(SiO 2) 1-x/SiO 2gate stacks
2007
I. Z. Mitrovic
Y. Lu
Octavian Buiu
Stephen Hall
Keywords:
Analytical chemistry
Leakage (electronics)
Materials science
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