PULSED LASER DEPOSITION OF HIGHLY ORIENTED (Pb, La)Ti03 THIN FKMS ON (001) LAO3 SUBSTRATES

Ferroelectric Pbo soLao ioTiO3 (PLTIO) thin films have been prepared on (001) LaA103 (LAO) and on Pt coated (100) Si (WSi) substrates using pulsed laser deposition (PLD) technique. Xray 0 -20 scan and the scanning electron microscopy (SEM) were used to analyze the fks’ structure and morphology, respectively. Energy dispersive analysis of X-ray (EDAX) was employed to probe the stoichiometry of the as deposited films. The ferroelectric P-E hysteresis loop was demonstrated by using a modified Sawyer-Tower circuit and the fiequency dependence of dielectric constant was measured by using an inductance-capacitance-resistance (LCR) analyzer. The effect of the dielectric bufZer layer in the film to the P-E hysteresis loop of the ferroelectric film was discussed.