Photoelectric effect from CsI by polarized soft x-rays
1991
Further studies are reported on the polarization dependence of
the photoelectric effect produced by soft X-rays from CsI. A major
difficulty in these experiments is the geometrical effects which
mimic the polarization signature. We present a detailed calculation
of these geometrical effects that are produced when the X-ray beam
is not precisely aligned on a rotatable plane photocathode. These
effects were observed experimentally and were used in turn to
precisely determine the alignment of the incident beam of polarized
X-rays on a rotatable photocathode. From these studies, we are able
to uniquely determine the true polarization dependence of the
photoemission from CsI. We confirm that the photoelectric effect in
CsI is dependent on the polarization state of the X-rays. The
"phase shift" which was reported previously has now been explained
as a result of these off-axis effects. This shows that there is no
intrinsic "phase shift" in the polarization dependence of the
photoemission from CsI. Preliminary surface analysis of the CsI
photocathode was pe'formed to determine the surface quality.
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