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Quantitative strain mapping in nano electronic silicon dvices by convergent beam electron diffraction
Quantitative strain mapping in nano electronic silicon dvices by convergent beam electron diffraction
2008
Aldo Armigliato
Roberto Balboni
Stefano Frabboni
Alessio Spessot
Keywords:
convergent beam
strain mapping
Optoelectronics
Silicon
Materials science
Nano-
Electron diffraction
Correction
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