The Effect of Thin Film Thickness on Thermal Nonlinear Optical Properties and Surface Morphology of Cu Nanostructure Thin Films

Abstract This study aims to Investigate the effect of thin film thickness on thermal nonlinear optical properties and Surface morphology of Cu Nanostructure Thin Films. Samples are deposited by Thermal Evaporation (TE) and Pulsed Laser Deposition (PLD) Methods. The Morphology of the samples are studied by Field Emission Scanning Electron Microscope (FESEM) images, both samples deposited by PLD and TE showed surface with island nanoparticles. To study the nonlinear optical characteristics of the samples, Z-scan technique was employed. Both TE and PLD samples showed nonlinear absorption and nonlinear refraction. As the thickness of the layers increased, the sign of the nonlinear refraction index changed and the nonlinear absorption coefficient increased.