Nanolaminated Al2O3/HfO2 dielectrics for silicon carbide based devices

2020 
Nanolaminated aluminum oxide (Al2O3)/hafnium oxide (HfO2) thin films as well as single Al2O3 and HfO2 layers have been grown as gate dielectrics by the plasma enhanced atomic layer deposition techn...
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    0
    References
    0
    Citations
    NaN
    KQI
    []