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A substitution method for nanoscale capacitance calibration using scanning microwave microscopy
A substitution method for nanoscale capacitance calibration using scanning microwave microscopy
2020
José A. Morán-Meza
Alexandra Delvallée
Djamel Allal
François Piquemal
Keywords:
Microscopy
Calibration
Physics
Capacitance
Optics
Nanoscopic scale
Microwave
Substitution method
Correction
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