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Determination of Thickness and Composition of Thin AlxGa1-xAs Layers on GaAs by Total Electron Yield (TEY)
Determination of Thickness and Composition of Thin AlxGa1-xAs Layers on GaAs by Total Electron Yield (TEY)
1994
Maria F. Ebel
Robert Svagera
Horst Ebel
Robert Hobl
Michael Mantler
Johann Wernisch
Norbert Zagler
Keywords:
Analytical chemistry
Electron
X-ray absorption spectroscopy
Materials science
Composition (visual arts)
electron yield
Correction
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