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TEM for strain-engineered devices: Dark-field inline holography for nanoscale strain mapping
TEM for strain-engineered devices: Dark-field inline holography for nanoscale strain mapping
2012
V. B. Özdöl
P. A. van Aken
C. T. Koch
Keywords:
Nanotechnology
Holography
Dark field microscopy
Nanoscopic scale
Strain (chemistry)
Optics
Materials science
strain mapping
Correction
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