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Leakage current analysis for dislocations in the modified Na-flux GaN single crystal
Leakage current analysis for dislocations in the modified Na-flux GaN single crystal
2018
Takeaki Hamachi
Shotaro Takeuchi
Tetsuya Tohei
Masayuki Imanishi
Mamoru Imade
Yusuke Mori
Akira Sakai
Keywords:
Conductive atomic force microscopy
Nuclear magnetic resonance
Single crystal
Leakage (electronics)
Flux
Dislocation
Materials science
Condensed matter physics
Correction
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