Old Web
English
Sign In
Acemap
>
Paper
>
Capacitance-Voltage Characteristics of Metal-Oxide-Strained Semiconductor Si/SiGe Heterostructures
Capacitance-Voltage Characteristics of Metal-Oxide-Strained Semiconductor Si/SiGe Heterostructures
2002
Autran J-L
Nicolas Cavassilas
Keywords:
Oxide
Heterojunction
Electronic engineering
Voltage
Semiconductor
Metal
Materials science
Capacitance
Optoelectronics
capacitance voltage
Correction
Source
Cite
Save
Machine Reading By IdeaReader
1
References
5
Citations
NaN
KQI
[]