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Infrared Microthermography for Integrated Circuit Fault Location; Sensitivity and Limitations
Infrared Microthermography for Integrated Circuit Fault Location; Sensitivity and Limitations
2002
Scott Kiefer
Manoj Nair
Paul W. Sanders
John W. Steele
M. Sutton
R. Thoma
Syd R. Wilson
G. Albright
C. Li
J. McDonald
Keywords:
Electronic engineering
Infrared
Computer science
Integrated circuit
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