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Investigating Stability of Si Sphere Surface Layer in Ambient–Vacuum Cyclic Measurements Using Ellipsometry
Investigating Stability of Si Sphere Surface Layer in Ambient–Vacuum Cyclic Measurements Using Ellipsometry
2021
Kazuaki Fujita
Kenichi Fujii
Lulu Zhang
Yasushi Azuma
Shigeki Mizushima
Naoki Kuramoto
Keywords:
Stability (probability)
Composite material
Materials science
Ellipsometry
Surface layer
Correction
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