A method of compensating parasitic inductances in the current measuring resistors

With the method, the influence of a parasitic inductance of a known resistive component having current measuring resistor (10) can be taking place on the basis of the size of a voltage drop across the current measuring resistor (10) determining the magnitude of a current with a timing offset having the recurring periods of time, within which drops the current and / or increases, whereby the current is within a measurement interval, which is equal to at least a portion of a time portion of the time course of the current is determined at a measuring point in time at which its value is substantially equal to the average value of current within the measurement interval, , Here, the course of the voltage drop across a traversed by the current to be measured with the above timing resistor is determined, which has a pure resistance value which is equal to the resistive component of the current measuring resistor (10). The course of the voltage drop determined deviates from the adjusting over the current measurement resistor (10), the course determined by measurement of the voltage drop resulting from an offset from the parasitic inductance. The measurement time is as far advanced within the measuring interval until the metrologically sensed course of the voltage drop across the current measuring resistor (10) is substantially equal to the course of the voltage drop across the resistor with a purely ohmic portion, which is equal to the resistive component of the current resistance determined, and is compensated for the offset.