Addressing IC component Quality and Reliability assurance challenges
2009
This paper highlights some of the key challenges for the Quality and Reliability of semiconductor components based on field return data and root cause Pareto analysis. Some key learnings are discussed. The paper also discusses the topic of the role of organizations, its tasks and infrastructure necessary to achieve the required IC component quality and reliability. Specific examples are discussed. In the second part of this paper we discuss and summarize some of the reliability challenges experienced from the perspective of a customer for fabless semiconductor companies.
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