High-resolution x-ray spectromicroscopy with the Tokyo electron beam ion trap

A high-resolution x-ray spectrometer with a spherically bent quartz crystal and an x-ray sensitive charge coupled device (CCD) have been applied to the observation of highly charged ions produced and trapped in the Tokyo electron beam ion trap (EBIT). The spectrometer made it possible to measure the spatial distribution and wavelength of the radiation at the same time. A simple, but lower energy resolution method was also used, by taking advantage of the intrinsic energy resolution of the CCD. The possibility to apply such techniques to diagnostics of an EBIT is discussed.