The X-ray characterization of Bi2Sr2CaCu2O8+x single crystals grown by different methods

Abstract We report on results of systematic X-ray investigations of the Bi 2 Sr 2 CaCu 2 O 8+ x (2212) single crystals grown by slow cooling, top seeded solution growth and travelling solvent floating zone (TSFZ) methods. The typical concentrations of dislocations in the Bi-2212 crystals are estimated from width of peaks. According to the obtained X-ray topography and diffractometry data, these crystals demonstrate misorientation anisotropy around different crystallographic axes, which is a consequence of incommensurate modulation in this compound. The highly perfect crystals grown by TSFZ method are found to demonstrate the abnormal transmission X-ray diffraction effect (Borrman effect).