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Electrooptic Inspection of Vector Leakage in Radiofrequency Multichip Modules.
Electrooptic Inspection of Vector Leakage in Radiofrequency Multichip Modules.
2012
Christopher T. Rodenbeck
Kenneth A. Peterson
Charles E. Sandoval
Edward Mark Russick
Ray A. Ortiz
Karl F. Brakora
Jack Thiessen
Keywords:
Leakage (electronics)
Electronic engineering
Materials science
Optoelectronics
Correction
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