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SURFACE STOICHIOMETRY DETERMINATION USING REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION AND ATOMIC-LAYER EPITAXY : THE CASE OF ZNTE(100)
1995
Keywords:
- Selected area diffraction
- Atomic layer epitaxy
- Surface reconstruction
- Electron backscatter diffraction
- Nuclear magnetic resonance
- Electron diffraction
- Low-energy electron diffraction
- Gas electron diffraction
- Reflection high-energy electron diffraction
- Physics
- Stoichiometry
- Condensed matter physics
- Optics
- Molecular physics
- Correction
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