Radiation Characterization of a 0.11 micrometer Modified Commercial CMOS Process

C. Poivey,Hak S. Kim,Miguel A. Vilchis,Jim Forney,Anthony M. Phan,K. LaBel,Rajan K. Saigusa,Rick Finlinson,A. Sukharnov,Verne Hornback,Jun Song,Jeffrey Tung,Mohammad R. Mirabedini

Radiation Characterization of a 0.11 micrometer Modified Commercial CMOS Process

2006

C. Poivey
Hak S. Kim
Miguel A. Vilchis
Jim Forney
Anthony M. Phan
K. LaBel
Rajan K. Saigusa
Rick Finlinson
A. Sukharnov
Verne Hornback
Jun Song
Jeffrey Tung
Mohammad R. Mirabedini

This viewgraph presentation reviews the tests of a modified commercial CMOS chip for operation in radiation environments. The presentation has pictures of the chip, and charts of the test results.

Keywords:

Electronic engineering
Micrometer
Chip
Radiation
Electrical engineering
CMOS
Engineering
cmos process
cmos chip
Radiation damage

Correction
Source
Cite
Save
Machine Reading By IdeaReader

References

Citations