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3D Hall probe integrated in 0.35 µm CMOS technology for magnetic field pulses measurements
3D Hall probe integrated in 0.35 µm CMOS technology for magnetic field pulses measurements
2008
J Pascal
L. Hebrard
V. Frick
J.P. Blonde
Keywords:
CMOS
Materials science
Optoelectronics
Magnetic field
Correction
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