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Duty cycles in digital logic applications: a realistic way of considering hot-carrier reliability
Duty cycles in digital logic applications: a realistic way of considering hot-carrier reliability
1990
Weber
Brox
Kunemund
Schmitt-Landsiedel
Wang
Keywords:
Duty
Stress (mechanics)
degradation
Logic gate
Electronic engineering
hot carrier reliability
Computer science
transient analysis
Correction
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