Research on Testing Logical Characteristics and Microcurrent of the Smartcard System

In accordance with the testing theory of electrical specifications and logical characteristics of the ISO7816 smartcards,a new design method for testing the microcurrent and logical characteristics of the smartcard system has been introduced.The system consists of main control module,data collection,data transmission,storage module and logical testing module.The smartcard's base pins input or output the current through the transformation of current to voltage.Every route of the analog signal is reliable and accurate after adjusting the chip.Data collection and transmission module adopts the high-speed MCU.The 24-bits high accuracy A/D is used for data collection.And the collected data are stored in the FLASH storage module in real time.Then the data are sent to the upper computer through the COM interface.The test result shows the system works well.