Light and Dark IV Measurements Correlations for Space Solar Array Failure Detection in Stowed Configuration

Performance control steps during manufacturing and/or handling of space solar array can consume time and money. For instance the measurement under AM0 spectrum of a III-V photovoltaic array (PVA) performance (e.g. in production line, during satellite integration tests, etc.) requires complex, large and precise equipment. In this study, we evaluate the possibility to replace the LIV by DIV control step during PVA manufacturing / handling sequence. We investigate the correlations between light IV (LIV), dark IV (DIV) and electroluminescence (EL) characterizations on PVA breadboards composed of Si or III-V multi-junction solar cells. Controlled impact cycles are performed on PVA breadboards, and light/dark IV performance degradations are monitored.