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Influence of trap charges on surface temperature measurement of Si by KFM
Influence of trap charges on surface temperature measurement of Si by KFM
2017
Akito Oka
Yuuhei Suzuki
Kawai Taketo
M. Navaneethan
Tatsuoka Hirokazu
Faiz Salleh
Ikeda Hiroya
Keywords:
Atomic physics
Temperature measurement
Materials science
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