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Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM
Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM
2015
Dakai Chen
Edward P. Wilcox
Melanie D. Berg
Hak S. Kim
Anthony M. Phan
Marco Figueiredo
Christina M. Seidleck
Kenneth A. LaBel
Keywords:
Computer memory
Non-volatile random-access memory
Electronic engineering
Physics
EEPROM
Electrical conductor
Correction
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