PaTran: Translation Platform for Test Pattern Program

For the testing of memory chips, automatic test equipment (ATE) uses pattern program to generate a bit vector for each clock. Pattern programs are not portable across different ATEs, requiring a different program for each ATE, even when they test the same memory chip. Many solutions and in-house tools have been proposed for this portability problem, but they were not completely successful. This paper proposes PaTran, a software translation platform for pattern programs. PaTran employs intermediate representation (IR) based on the pattern itself, generated by simulating the source pattern program. It synthesizes the target program by reconstructing the program statements from the IR. Since the IR size is huge for product-level programs, PaTran employs a concise form of IR, embedded with repetition information. Implementation of PaTran is based on the web and server-client model.