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Fine-grained BaZr[sub 0.2]Ti[sub 0.8]O₃ thin films for tunable device applications
Fine-grained BaZr[sub 0.2]Ti[sub 0.8]O₃ thin films for tunable device applications
2007
Z. Ying
P. Yun
Danyang Wang
Xiaoyuan Zhou
Z. T. Song
S. L. Feng
Yu Wang
Helen L. W. Chan
Keywords:
Thin film
Crystallography
Nuclear magnetic resonance
Atomic force microscopy
X-ray crystallography
Physics
Zirconium
ferroelectric thin films
Condensed matter physics
Optoelectronics
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