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Charge Migration Analysis of 3D SONOS NAND Flash Memory Using Test Pattern
Charge Migration Analysis of 3D SONOS NAND Flash Memory Using Test Pattern
2020
Jun-Kyo Jeong
Jaeyoung Sung
Hee-Hoon Yang
Hi-Deok Lee
Ga Won Lee
Keywords:
Electronic engineering
Embedded system
nand flash memory
Computer science
Correction
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