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Status of the Standard Electron Beam Diagnostics of the EU-XFEL
Status of the Standard Electron Beam Diagnostics of the EU-XFEL
2018
A. Affeldt
F. Krivan
Frank Brinker
Ru. Neumann
Timmy-Jan Lensch
H. Tiessen
P Smirnow
Olivier Napoly
M. Roggli
Waldemar Koprek
R. Awwad
Alexandr Ignatenko
C. Simom
M. Werner
M. Stadler
T Wamsat
G. Kube
Goran Marinković
Anke Ziegler
I. Krouptchenkov
K. Knaack
O. Hensler
Raphael Baldinger
Ch. Gerth
R. Ditter
R.Susen
S. Meykopff
Alexander Kaukher
M. Pelzer
H. Sokolinski
O Frank
Dirk Lipka
G Schlesselmann
Regina Barrett
B. Michálek
M Hoeptner
J Liebing
D. Treyer
Maximilian Holz
S. Vilcins-Czvitkovits
Boris Keil
V. Rybnikov
C Wiebers
Kay Wittenburg
Gunnar Priebe
G Petrosyan
Z Pisarov
B. Lorbeer
N Wentowski
V. Gharibyan
T. Limberg
R. Zahn
Reinhard Neumann
M. Drewitsch
A. Delfs
C Stechmann
Matthias Scholz
J. Neugebauer
K. Rehlich
Marc Guetg
J. Wilgen
F. Schmidt-Foehre
J. Lund-Nielsen
P Pototzki
M. Steckel
Juergen Kruse
L. Shi
Bolko Beutner
Dennis Renner
D. Noelle
Winfried Decking
N. Baboi
B. Lemcke
Keywords:
Cathode ray
Materials science
Optics
Correction
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