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Acemap > Paper > 28pAL-5 制限視野ナノ電子回折を用いたアモルファスMRO構造のサイズ計測(28pAL X線・粒子線(電子線,陽電子),領域10(誘電体,格子欠陥,X線・粒子線,フォノン))

28pAL-5 制限視野ナノ電子回折を用いたアモルファスMRO構造のサイズ計測(28pAL X線・粒子線(電子線,陽電子),領域10(誘電体,格子欠陥,X線・粒子線,フォノン))

2014 
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